The Pd2HgSe3 phase was synthetized from individual elements by the silica glass tube technique and its crystal structure has been refined by the Rietveld method. The Pd2HgSe3 phase crystalizes in P$\bar 3$m1 space group with the unit-cell parameters a = 7.3096(2) Å, c = 5.2829(1) Å, V = 244.45(1) Å3, Dc = 8.84 g/cm3, and Z = 2. In its layered crystal structure, the [PdSe6] octahedra share opposing Se–Se edges with adjacent [PdSe4] squares forming layers parallel with the (001) plane. The layers show AA type stacking along the c-axis. Hg atoms occupy the anti-cubooctahedral voids between two consecutive layers. Pd2HgSe3 is isostructural with Pt2HgSe3 and Pt4Tl2X6 (X = S, Se, or Te) phases. The structure can be viewed as a 2a.2a.c superstructure of PtSe2.

We use density functional theory meta-generalized gradient approximation TPSS + D3(BJ) + U + J calculations to investigate the energetics and geometry of water molecules in the flexible metal-organic framework material Materials of Institut Lavoisier (MIL)-53(Cr) as a function of cell volume. The critical concentration of water to cause the transition from the large pore (lp) to the narrow pore (np) structure is estimated to be about 0.13 water molecule per Cr. At a concentration x = 1 water molecule per Cr, the zero-temperature np and lp configurations each have a hydrogen bond between the H of each framework hydroxyl group and water oxygen (OW). At intermediate volumes, water dimer-like configurations are observed. A concentration x = 1.25 leads to hydrogen bonding between water molecules in the np phase that is absent for x = 1. Our results suggest possible mechanisms for pore closing in hydrated MIL-53(Cr).

Polycrystalline Mn1.1Fe0.9P0.76Ge0.24 was prepared by mechanical alloying and spark plasma sintering. Neutron diffraction was used to determine the structure of the title compound, and its nuclear and magnetic structures were refined using the Rietveld method. It is found that temperature and magnetic field can induce phase transition between the paramagnetic and the ferromagnetic phases in the material, and the paramagnetic and ferromagnetic phases have very distinct crystal structures and different Ge contents.

The X-ray fluorescence holography (XFH) method has drawn the attention of many researchers as a novel experimental technique for imaging a three-dimensional local atomic structure around a certain element in a single crystal. Synchrotron radiation (SR) has been mainly used for the measurements because of extremely weak signals that are about 0.3% of isotropic fluorescent radiation. The measurements limited to the use of a SR source clearly hinder from increasing the number of the users. Thus, we developed a laboratory XFH equipment with a conventional X-ray source by using a singly bent graphite monochromator with a large curvature and X-ray detector for a high counting rate. With this equipment, we have successfully demonstrated that high-quality hologram data of a gold single crystal almost equivalent to those with a SR source are obtained. Four different holograms are recorded in the normal and inverse XFH modes. An atomic image reconstructed from these holograms patterns shows a distinct atomic image of Au

Y6Cr4+xAl43−x (x = 2.57); space group P63/mcm, a = 10.8601(1) Å, c = 17.6783(3) Å, V= 1805.7(1) Å3, Z=2; isostructural to Yb6Cr4+xAl43−x, (x=1.76) with two aluminium sites partially occupied by chromium (44% and 27% Cr). YCr4−xAl8+x (x=1.22); space group I4/mmm, a = 9.0299(2) Å, c = 5.1208(2) Å, V=417.55(3) Å3, Z=2, disordered variant of CeMn4Al8 with one chromium site (8f) partially occupied by aluminium (33% Al); X-ray powder diffraction data were collected on a well-crystallized multiphase sample containing 43 wt.% of Y6Cr4+xAl43−x, 27 wt.% of Y2Cr8−xAl16+x, 16 wt.% of Al, 13 wt.% of YAl3, and traces of Y2O3. Structure refinement converged at Rwp = 2.0% and RB = 3.5, 3.6% resp. for a total of 78 parameters and 1190 reflections.

Order-disorder transformations were studied in annealed and high-energy ball-milled near-equiatomic FeCo alloys. X-ray diffraction with Co Kα radiation enables to follow disordering with milling time because of anomalous dispersion.

Phase diagrams and X-ray powder diffraction patterns provide critical information for thermoelectric (TE) research. We have conducted a survey of phase diagrams and powder diffraction patterns of TE systems in the ASM (American Society for Metals) Metal/Alloy database and ICDD (International Centre for Diffraction Data) PDF (Powder Diffraction File), respectively, for their availability and crystal systems. In this report, we focus on TE materials that have the half-Heusler XYZ structure, and related compounds, based on a set of materials selection rules. We found that among 306 potential XYZ compounds that we have surveyed, 234 have powder diffraction patterns in the PDF, but only 28 have phase diagram information, and 67 do not have any crystallographic information. Among the 234 phases with powder patterns, 84 were reported to have cubic F43m half-Heusler type structure, and the remainder have hexagonal, orthorhombic or other structure types. Some XYZ compounds have both cubic and hexagonal phases. This information will provide the basis for future activities for the improvement of the databases. These activities include filling the missing gaps in both phase equilibria database and the PDF, as well as adding TE and pertinent physical properties to the PDF.

Ternary Al–Cu–Ir phases, isostructural to the Al–Cu–Rh ω and C2 phases, were found to be around the Al70Cu20Ir10 and Al60Cu15Ir25 compositions, respectively. Using powder X-ray diffraction, the former was found to have a tetragonal structure (space group P4/mnc) with a=6.4142(9) Å and c=14.842(4) Å, and the latter has a cubic structure (space group Fm3) with a=15.3928(6) Å.

A previous paper portrayed sample preparation by fusion methodology and the XRF analysis conditions for the calibration of cement materials [Bouchard et al., 2009. “Global cement and raw materials fusion/XRF analytical solution,” Adv. X-Ray Anal. 53, 263–279]. The results of two well known cement chemical analysis Standard Methods were also presented. These results proved that this robust analytical method is able to qualify by the ASTM C114 [ASTM C114-08 (2008). “Standard test methods for chemical analysis of hydraulic cement,” Annual Book of ASTM Standards Vol. 04.01 (ASTM International, West Conshohocken, PA), pp. 150–157)] and ISO/DIS 29581-2 [Draft Standard, 2007-07 (2007). “Methods of testing cement—Chemical analysis of cement—Part 2: Analysis by X-ray fluorescence” ISO/DIS 29581-2, 2007, pp. 1–30]. This robust analytical method was developed using an automated fusion instrument for the sample preparation and a WDXRF spectrometer for the determination of all elements of interest relating to the cement industry. This method was used to prepare finished products, process materials, as well as a very large range of raw materials. The first part of this second paper examines all the XRF analysis conditions for the calibration of the raw materials using the robust fusion sample preparation methodology as well as the numerous reference materials (RMs) used for this analytical application. All interesting results will be presented. The second part of this paper reveals the rapid analytical method results using sample preparation by fusion on nonignited samples. It will also be proven that this faster method, combined with the WDXRF spectrometer, complies with both cement analysis Standard Methods: ASTM C114 and ISO/DIS 29581-2.

The ICDD sponsored a round robin on the quantitative Rietveld phase analysis of pharmaceuticals. 11 participating laboratories from the pharmaceutical community submitted both raw data and processed quantitative results. The purpose of the round robin was to evaluate current practices in laboratories, so procedures and methods were not specified, but they were recorded. Cluster analysis tools were applied to all the data sets and their use helped identify the root causes of several types of errors in specimen preparation, data treatment, and Rietveld analysis. The authors considered this round robin to be difficult. Sample homogeneity was an issue and molecular orientation was observed in many data sets. Each material studied has structural polymorphs so the selection of starting parameters and their refinement was nontrivial. Similar to prior round robins on inorganic materials and minerals, this round robin identified operator errors as the major contributor to poor results. Four laboratories achieved excellent results on all phases in all three samples, with accuracy within relative errors of 5% to 10%.

The determination of thin film thickness by four X-ray reflectivity methods (namely, the peak separation, the Fourier transform, the modified Bragg equation, and the curve-fitting methods) has been studied. An analysis of SrS and BaF2 thin films showed thickness values determined by the methods agreed to within 4%. The curve-fitting method had the highest accuracy but was time-consuming. The peak separation, the Fourier transform, and the modified Bragg equation methods are considerably faster and, on average, gave 2.8%, 0.9%, and 0.2% larger thicknesses than those of the curve-fitting method.

The microstructure evolution in pure copper deformed by rolling at liquid nitrogen temperature was determined by using X-ray diffraction peak profile analysis. The crystallite size distribution and defects evolution were determined as a function of different reduction levels (e.g., 67%, 74%, 87%, and 97%). By using the Multiple Whole-Profile fitting procedure the Fourier transforms of the experimental X-ray peak profiles were fitted all at once by theoretical calculated functions. Here it is assumed that the crystallites are spherical shape and have a log-normal size distribution. It is also supposed that the strain broadening of the profiles is caused by 〈110〉 {111}-type dislocations. The results show that the median and the variance of the crystallite size distribution decreases as the deformation reduction increases. The dislocation density has a minimum value at 74% reduction. The increase of the dislocation density at higher deformation levels is due to the nucleation of new generation of dislocations from the crystallite grain boundaries. It was found that the edge dislocation type dominate, the dislocation network formed during the deformation process.

A new semi-empirical approximation for the asymmetry function to be used in the X-ray Rietveld analysis has resulted in lower values of the so-called goodness-of-fit index, defined as S = Rwp/Rexp, where Rwp is the R-weighted pattern and Rexp is the R-expected [R. A. Young, The Rietveld Method (Oxford U.P., Oxford, 1993)], with respect to the corresponding values obtained with the classical approximation used by Rietveld in his fundamental paper. A comparing test of the two asymmetry functions was carried out for the cubic Y2O3 and for αAl2O3 using either pseudo-Voigt or Pearson VII symmetrical functions and two diffractometers. As in the case of the Rietveld approximation, the present one, which employs an exponential function, is optimized using only one fitting parameter. Experimentally, the asymmetry can be considerably diminished by using Soller slits with a small opening angle (≤2°).

Residual stress measurements on strongly textured materials using the standard sin2ψ evaluation show significant non-linearities. According to EN 15305 there is currently no existing solution for this problem. A method is presented that solves this problem. It is based on two tools. (i) The use of a one-dimensional detector having a large capture angle that yields the full diffraction profiles at each point of the pole figures. Therefore, some hundreds of d-values can be used for the stress calculation. (ii) Data evaluation with the recently developed generalized sin2ψ method. This has the advantage of being based on a flawless theory (Hooke's law in the special form of Dölle–Hauk's equation) and being able to handle any distribution of measurement directions and any number of measured data. The method was successfully tried out at a sheet of brass with significant texture.

In this work, the reduction mechanism of potassium chromate (K2CrO4) was investigated via in situ high-temperature X-ray diffraction coupled with Fourier transform infrared spectroscopy. During the hydrogen reduction of K2CrO4, the formation of K3CrO4, KCrO2, and KxCrO2 were detected for the first time. The study discovered that K2CrO4 was firstly reduced to K3CrO4 and an amorphous Cr(III) intermediate product at low temperature (400–500 °C). Moreover, the K3CrO4 was the only crystalline material at this stage. As the temperature increased, a stabilized amorphous CrOOH was formed. At a high temperature (550–700 °C), KCrO2 was generated. Interestingly, a portion of KCrO2 was spontaneously decomposed during the hydrogen reduction, accompanying by the formation of K0.7CrO2. Finally, the results clearly illustrated the reduction mechanism of K2CrO4: K2CrO4 → K3CrO4 → amorphous intermediate → KCrO2.

In the last few decades, X-ray diffraction (XRD) systems have been paramount and irreplaceable in controlling bauxite exploration, as well as Bayer and reduction processes. XRD quantitative phase analysis in the aluminum industry witnessed a steady deployment of the Rietveld method, which at present progressively replaces existing methodologies in research and plant laboratories. Rietveld analysis not only helped to surpass traditional XRD calibration methods, it also opened the door for new applications previously not possible. The use of the Rietveld method to characterize selected materials unique to the aluminum industry, such as bauxite, red mud, and alumina is demonstrated and discussed. This paper also presents how synchrotron-based diffractograms obtained for bauxite and red mud samples allowed a much better understanding of mineralogical representation, and made it possible to leverage their Rietveld quantification. Despite clear advantages, the Rietveld method also has limitations that are revealed. For alumina phase quantification, a dedicated Rietveld analytical program was built with structure data for eight alumina mineralogical phases: alpha, beta (β-Al2O3 = Na2O•11Al2O3), delta, gamma (2), kappa, sigma, and theta. The paper gives unique examples of phase quantification in aluminas of various origins and phase composition.

This paper further confirms that the direct measurement of diffraction angles at different temperatures by using the X-ray diffractometer is better than measurement of the lattice parameters for the rapid and accurate determination of the linear thermal expansion of silicon. High purity silicon has the linear expansion coefficient, α= (2.45±0.05) × 10−6/°C at room temperature. This value does not change for doped P-type and N-type silicon.

New powder and crystallographic data for gorceixite, a mineral of the crandallite subgroup of the alunite group, are reported and compared with current Powder Data File (PDF) patterns and with calculated patterns. Both d-spacings and intensities have been evaluated, and the results indicate a significant improvement over existing patterns. Indexing of the reflections is given for the true monoclinic symmetry, Cm (8), the pseudorhombohedral symmetry, (166) (to compare with structurally analogous minerals), and the pseudocubic symmetry, Fm3m (225). Because of the strong pseudosymmetry, the overall figure of merit is lower than would be the case for indexing in one of the pseudospace groups.