The crystal structures of four samples of anhydrite, CaSO4, were obtained by Rietveld refinements using synchrotron high-resolution powder X-ray diffraction (HRPXRD) data and space group Amma. As an example, for one sample of anhydrite from Hants County, Nova Scotia, the unit-cell parameters are a = 7.00032(2), b = 6.99234(1), c = 6.24097(1) Å, and V = 305.487(1) Å3 with a > b. The eight-coordinated Ca atom has an average <Ca-O> distance of 2.4667(4) Å. The tetrahedral SO4 group has two independent S-O distances of 1.484(1) to O1 and 1.478(1) Å to O2 and an average <S-O> distance of 1.4810(5) Å. The three independent O-S-O angles [108.99(8) × 1, 110.38(3) × 4, 106.34(9)° × 1; average <O-S-O> [6] = 109.47(2)°] and S-O distances indicate that the geometry of the SO4 group is quite distorted in anhydrite. The four anhydrite samples have structural trends where the a, b, and c unit-cell parameters increase linearly with increasing unit-cell volume, V, and their average <Ca-O> and <S-O> distances are nearly constant. The grand mean <Ca-O> = 2.4660(2) Å, and grand mean <S-O> = 1.4848(3) Å, the latter is longer than 1.480(1) Å in celestite, SrSO4, as expected.

Characterization of semi and noncrystalline materials, monitoring structural phase transitions in situ, and obtaining structural information together with spatial distribution of the investigated material are only a few applications that hugely benefitted from the combination of high-energy X-rays and modern algorithms for data processing. This work examines the possibility of advancing these applications by shortening the data acquisition and improving the data quality by using the new high-energy PILATUS3 CdTe detector.

In this paper we propose a fitting procedure to describe the bandpass effect on all x radiation that passes through a focusing graphite monochromator used on the diffracted beam. The proposed bandpass function is: M(2θ)=1/(1+Kmon1sKmon2), with s=(2 sin θ)/λ, where Kmon1 and Kmon2 are constants which have been refined by means of a Rietveld analysis, using a physically modeled background (Riello et al., J. Appl. Crystallogr. 28, 115–120). We have investigated two polycrystalline powders: α-Al2O3 and a mixture of α and β-Si3N4. The so-obtained bandpass functions for these materials are close enough to conclude that they depend only on the used experimental setup (in the present case the X-Pert-Philips diffractometer with a graphite focusing monochromator). Knowledge of the bandpass function is important to suitably model the Compton scattering, which is a component of the background scattering. The present procedure allows one to avoid the direct experimental determination of the bandpass function, which requires the use of another monochromator (analyzer) and another tube with an intense white spectrum.

An interactive computer program to display, process and analyze raw powder X-ray diffraction data is described. The program extensively employs graphic means of input and output with the help of “pop-up” windows and menus. In addition to those tasks that are common to most primary raw data analyzing programs, it performs many functions which are generally assigned to separate secondary programs. These functions include on-screen correction of d-spacing with reference to a standard compound, calculation of peak width and crystallite size, subtraction of patterns for differential X-ray diffraction and unrestricted overlay of patterns. The advantages of an integrated single program to process X-ray diffraction data in mineral research are illustrated and discussed.

Using X-ray grazing incidence diffraction (GID) it is possible to perform a nondestructive analysis of the heterogeneous stress field for different volumes below the surface of the sample. The stress can be measured at very small depths, of the order of a few μm. The penetration depth of radiation is almost constant in a wide 2θ range for a given incidence angle α. It can be easily changed by an appropriate selection of α angle (or also by using a different type of radiation). There are, however, some factors which have to be corrected in this technique. The most important is the refraction of X-ray wave: it changes the wavelength and direction of the beam. Both effects modify a pick position. A corresponding correction was calculated and tested on ferrite powder and on 316L austenite stainless steel sample.

The modal analysis of samples belonging to the zeolite-rich pyroclastic formation named “Neapolitan yellow tuff” (Central and Southern Italy) has been determined by full-profile refinement of X-ray powder diffraction (XRPD) data using a combined Rietveld–RIR method. The quantitative analysis and especially the zeolite content is a profitable source for geo-petrographic and genetic considerations and as well an essential source to assess the physical and chemical properties of the bulk material for a feasible use in industrial applications. Albeit a wealth of methods are used for the quantitative determination of zeolite content in pyroclastites they all fail for lack of accuracy as far as concerns the absolute standard deviation of the quantitative data. The outstanding outcomes achievable by using the Rietveld method make it as the most promising technique to fulfill this lack. The glass content in each sample is calculated by a combined Rietveld–RIR method in which a known amount of an internal standard is added to the mixture to rescale the Rietveld refined weight fractions into absolute values. Then, it is reasonable to designate this method as an external method according to the definition given by Hill and Howard (1987). Its counterpart is the internal method developed by Riello etal. (1995a,b). Other techniques such as the addition method and the background scattering volume calculation are developed to accomplish a further determination of the glass content. The results are compared to the values obtained from the Rietveld–RIR analysis. These experimental methods yield an over-estimation of the amorphous phase because the incoherent scattering contribution (air, absorption, sample holder, Compton scattering) is accounted for as the amorphous fraction itself. The glass content of each sample acquired from the Rietveld–RIR refinement on the “raw data” is compared to that accomplished from the refinement of incoherent scattering subtracted data. In addition, some largely used XRPD quantitative techniques such as the external standard and RIR (reference intensity ratio) and the influence of the sample loading method are accounted for in an internally consistent comparison among different procedures of analysis.

Rietveld refinement using neutron, laboratory X-ray, and synchrotron powder diffraction data of NIST SRM clinker 8488 was performed. Quantitative phase analysis (QPA) results were compared between data, and with other studies. QPA results for the main phases in the clinker were found to be in agreement between the different data used here, and in and other studies, although the QPA of the tricalcium silicate polymorphs was shown to be inconsistent. The QPA results for the tricalcium aluminate phase varied between data types, and the neutron data were unable to distinguish this phase.

Weld residual stress (RS) measurements are often undertaken on test-pieces which have been cut out from large components, yet it remains unclear to what extent the RSs in test-pieces are representative of those present in the original component. Similarly weld mechanical performance tests are frequently undertaken on cross-weld test-pieces without a proper understanding of the level or influence of retained RS. We present a systematic study of the relaxation of longitudinal RS in thin-plate butt welds produced using different materials and welding methods (FSW, laser-MIG, and pulsed-MIG). In each case the RSs were measured repeatedly in the same location as the welds were progressively and symmetrically cut down. Although cutting inevitably leads to stress redistribution, significant relaxation of the longitudinal RS was only observed when the weld length or width was reduced to below a certain value. This critical value appears to correlate with the lateral width of the tensile zone local to the weld-line and may be considered to be the characteristic length as defined in St. Venant’s principle. Further, it was found that the level of stress relaxation as a function of weld length for all the welds studied could be collapsed onto a single empirical curve using a simple approach based on the characteristic length scales of the weld. Given the range of materials and welding methods used, this relation appears to be of general use for thin-plate welds although further work is required to test the limits of its applicability.

Hydrothermally altered rocks hosting precious metal deposits frequently contain stacking disordered layer silicates. X-ray diffraction analysis using the Rietveld method can be used to determine mineral abundances in these rocks if suitable disorder models are applied. It is shown here that disorder models of kaolinite and pyrophyllite can be described by a recursive calculation of structure factors. This permits the physically sound refinement of real structure parameters of these disordered minerals and the determination of mineral abundances. Even mixtures containing two disordered Si–Al layer silicates can be quantified reliably. The developed disorder models can now be implemented in routine phase analysis, allowing the quantification of large numbers of samples to identify mineralogical gradients surrounding ore deposits.

Gamma-phase lithium aluminate (LiAlO2) is a ceramic powder used in molten carbonate fuel cells (MCFCs) and in other nuclear and ceramic applications. Upon exposure to water vapor and carbon dioxide at 25 °C, we have observed that gamma-LiAlO2 converts to lithium aluminum carbonate hydroxide hydrate, Li2Al4(CO3)(OH)12·3H2O(LACHH) and Li2CO3. The conversion was observed by X-ray diffraction (XRD) and carbonate analysis. An equation for the conversion is given, and the morphology is determined by scanning electron microscopy. A high-temperature XRD study and thermogravimetric/differential thermal analysis (TGA/DTA) showed that LACHH decomposes at 250 °C. The decomposition products of LACHH and Li2CO3 react to form first alpha-LiAlO2 and then gamma-LiAlO2 at temperatures of 650 and 1000 °C, respectively.

An additional statistical calibration for the Bruker D8 Discover microdiffractometer is necessary to obtain accurate reproducible 2θ data for cell-refinement work. This new approach uses a graphical mapping method of the 2θ error versus the location of a selected diffraction peak on the detector surface to describe the separate roles of different calibration procedures (rebiasing, flood field, and spatial corrections) and parameters (sample-to-detector distance, x-y center coordinate) in minimizing the error. Optimized parameters are used to obtain the lowest achievable Δ2θ with this setup. Intensity error relative to the position of the diffracted line on the detector was found to be consistent at up to 20% and could not be reduced using any of the investigated techniques and parameters.

The hydration of ordinary Portland cements (OPC) was investigated with X-ray powder diffraction (XRPD) technique, mainly using synchrotron radiation. In situ experiments were performed during the first hours of hydration to study the evolution of the crystalline phases in the system. The hydration was carried out with pure water and in the presence of additives such as superplasticizers and setting accelerating agents. As soon as water is added to the cement, ettringite crystallizes. Its evolution appears to be very complex, and lattice parameters change as a function of setting time, indicating a possible chemical evolution of ettringite with time and as a function of pH. CSH (Ca-Si-hydrate) forms after a few hours from the beginning of hydration. CSH can be indirectly quantified and its evolution studied.

X-ray powder data and refined cell parameters for two titanium carbonitride solid solutions are presented. Some deviations from Vegard's law were observed.

Quantification of potentially toxic single mineral phases in natural dusts of heterogeneous composition is critical for health hazard assessment. For example, crystalline silica, a human carcinogen, can be present as respirable particles in volcanic ash such as quartz, cristobalite, or tridymite. A method to rapidly identify the proportions of crystalline silica within mixed dust samples, such as volcanic ash, is therefore required for hazard managers to assess the potential risk of crystalline silica exposure to local populations. Here we present a rapid method for quantifying the proportions of single phases in the mineral assemblage of mixed dusts using X-ray diffraction (XRD) with a fixed curved position-sensitive detector. The method is a modified version of the whole-pattern peak-stripping (PS) method (devised by Cressey and Schofield [Powder Diffr.11, 35–39 (1996)]) using an internal attenuation standard (IAS) but, unlike the PS method, it requires no knowledge of other phases present in the sample. Ten synthetic sample mixtures were prepared from known combinations of four pure phases (cristobalite, hematite, labradorite, and obsidian), chosen to represent problematic constituents of volcanic ash, and analyzed by XRD. Results of the IAS method were directly compared with those of the PS method. The proportions of cristobalite estimated using the methods were comparable and accurate to within 3 wt %. The new IAS method involved less sample preparation and processing and, therefore, was faster than the original PS method. It therefore offers a highly accurate rapid technique for determination of the proportions of individual phases in mixed dusts.

The phases developed upon annealing of ZnSe, CdSe, and CdS semiconductors in air are investigated applying X-ray qualitative and quantitative phase analysis. The compositions of the thermally grown oxides over the 373–773 K temperature range are found to be ZnO and ZnSeO3 for ZnSe, CdSeO3 for CdSe and CdSO4 and Cd3O2SO4 for CdS. The percentage phase abundance of each phase is determined at each temperature applying a standardless method. At all temperatures, the oxides are predominantly ZnO with about 10% ZnSeO3 at 773 K in case of ZnSe and CdSO4 with about 9% Cd3O2SO4 at 773 K in case of CdS. The rate of oxidation with temperature is found to be nonlinear for the three chalcogenides. CdS is found to be more resistible for oxidation than CdSe and ZnSe.

For more than 80 years, the scientific community has extensively used International Centre for Diffraction Data's (ICDD®) Powder Diffraction File (PDF®) for material characterization, including powder X-ray diffraction analysis. Historically, PDF was made available for two major material types: one for inorganic analysis and the other for organic analysis. In the early years of the PDF, this two-material approach was implemented due to limited computer capabilities. With Release 2024, ICDD provides a comprehensive database consisting of the entire PDF in one database called PDF-5+, comprised of more than one million entries (1,061,898). The PDF-5+ with a relational database (RDB) construct houses extensive chemical, physical, bibliographic, and crystallographic data, including atomic coordinates and raw data, enabling qualitative and quantitative phase analysis. This wealth of information in one database is advantageous for phase identification, materials characterization, and several data mining applications in materials science. A database of this size needs rigorous data curation and structural and chemical classifications to optimize pattern search/match and characterization methods. Each entry in the PDF has an editorially assigned quality mark. An editorial comment will describe the reason if an entry does not meet the top-quality mark. The editorial processes of ICDD's quality management system are unique in that they are ISO 9001:2015 certified. Among several classifications implemented in PDF-5+, subfiles (such as Bioactive, Pharmaceuticals, Minerals, etc.) directly impact the search/match in minimizing false positives. Scientists with specific field expertise continuously review these subfiles to maintain their quality. This paper describes the features of PDF with an emphasis on the newly released PDF-5+.

With the explosive growth in the number of highly automated powder diffraction systems, many types of analyses which were previously considered a specialty analysis are now performed on a routine basis. Algorithms have been developed for measuring peak profiles from which crystallite sizes, residual microstrain, and X-ray crystal structure (Rietveld techniques for example) can be determined. However, these techniques require an instrumental peak profile calibration standard to correct the experimental data for instrumental broadening due to the system optics.

Significant problems are encountered when laboratories try to cross-correlate or reproduce published data due to the lack of a common reference material for instrumental calibration. This is particularly distressing in microstrain and crystallite size calculations which can be dramatically affected by a poor choice of standard materials. Microstrain and crystallite size measurement are becoming increasingly important for the characterization of advanced materials and catalysts.

A monochromatic source of X rays for sample excitation permits the use of pure elemental standards and relatively simple calculations to convert the measured fluorescent intensities to an absolute “basis of weight per unit weight of sample. Only the mass absorption coefficients of the sample for the exciting and the fluorescent radiation need be determined. Besides the direct measurement of these absorption coefficients in the sample, other techniques are considered which require fewer sample manipulations and measurements, These fundamental parameters methods permit quantitative analysis without recourse to the time consuming process of preparing nearly identical standards.

The structure of TeO3, first published by Dumora and Hagenmuller (1968), was redetermined from new X-ray data collected with a powder diffractometer using space group R3̄c with a = 4.901(2), c = 13.030(4) Å, V = 271.05(8) Å3 and Z = 6. Intensity data were obtained with CuKα, radiation (λ = 1.540598 Å). Structure refinement was performed with 49 reflections and led to R = 0.058. The material is isostructural with FeF3. Powder data are given.

The crystal structure of low temperature NaNiO2 has been refined by Rietveld methods using powder X-ray diffraction and neutron scattering data. The starting model was based on parameters that had been obtained earlier by X-ray film methods. At room temperature NaNiO2 is monoclinic, C2/m, a=0.53192(2), b=0.28451(1), c=0.55826(4) nm, β=110.449(2)°. NaNiO2 has a layered structure. The Ni–O layer is formed by edge sharing of Jahn–Teller elonganted NiO6 octahedra with Ni–O distances of 0.1911(2) nm and 0.2144(4) nm. The Na ions between these layers also exhibit a distorted octahedral coordination with Na–O distances of 0.2328(2) nm and 0.2369(4) nm. The final R values were Rwp=0.069, RI=0.059, Rexp=0.059 for the neutron and Rwp=0.032, RI=0.034, Rexp=0.017 for the X-ray data.