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Binary Programming and Test Design

Published online by Cambridge University Press:  01 January 2025

T. J. J. M. Theunissen
T. J. J. M. Theunissen*
Affiliation:
National Institute for Educational Measurement (CITO), Arnhem, The Netherlands
*
Requests for reprints should be sent to T. J. J. M. Theunissen, Cito, P.O. Box 1034, 6801 MG Arnhem, THE NETHERLANDS.
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Abstract

An algorithmic approach to test design, using information functions, is presented. The approach uses a special branch of linear programming, i.e. binary programming. In addition, results of some benchmark problems are presented. Within the same framework, it is also possible to formulate the problem of individualized testing.

Keywords

linear programmingbinary programminginformation functiontest-designindividualized testingitem bank
Type
Original Paper
Information
Psychometrika , Volume 50 , Issue 4 , December 1985 , pp. 411 - 420
Copyright
Copyright © 1985 The Psychometric Society

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Footnotes

I would like to thank my colleagues N. Veldhuijzen, H. Verstralen and M. Zwarts for their suggestions and comments. Furthermore, I would like to thank Professor W. van der Linden, Department of Educational Measurement and Data Analysis, Technological University Twente, for offering facilities at his department; Ellen Timminga of the same department and S. Baas, department of Operational Research at the same University for their efforts in linear programming.

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