Fluorometholone (brand names: Efflumidex, Flucon, FML Forte, and FML) is a prescription drug classified as a synthetic glucocorticoid used to treat optical inflammation or diseases. Commercial fluorometholone, CAS #426-13-1, crystallizes in the monoclinic space group P21 (#4) with a = 6.40648(2), b = 13.43260(5), c = 11.00060(8) Å, β = 92.8203(5)°, V = 945.517(5) Å3, and Z = 2. A reduced cell search in the Cambridge Structural Database (Groom et al., Reference Groom, Bruno, Lightfoot and Ward2016) yielded one previous structure determination (Park et al., Reference Park, Lee and Cho1992), using single-crystal data at 292 K.
In this work, the sample was ordered from the United States Pharmacopeial Convention (Lot # R032K0) and analyzed as-received. The diffraction data were collected on beamline 11-BM at the Advanced Photon Source, Argonne National Laboratory. The room temperature (295 K) crystal structure was refined using synchrotron (λ = 0.412826 Å) powder diffraction data and optimized using density functional theory (DFT) techniques. Hydrogen positions were included as a part of the structure and were re-calculated during the refinement (Figure 1).
The agreement of the Rietveld-refined and DFT-optimized structures is excellent; the root-mean-square Cartesian displacement is 0.060 Å. In addition to the O–H⋯O hydrogen bonds observed by Park et al. (Reference Park, Lee and Cho1992), C–H⋯O hydrogen bonds contribute to the crystal energy (Table I). The powder X-ray diffraction pattern of the compound has been submitted to ICDD® for inclusion in the Powder Diffraction File™.
a Correlation between overlap population and hydrogen bond energy not yet available for C–H⋯O hydrogen bonds.
b Intramolecular.
DEPOSITED DATA
CIF and/or RAW data files were deposited with ICDD. You may request this data from ICDD at info@icdd.com.
ACKNOWLEDGEMENTS
The use of the Advanced Photon Source at Argonne National Laboratory was supported by the U.S. Department of Energy, Office of Science, and Office of Basic Energy Sciences under Contract No. DE-AC02-06CH11357. This work was partially supported by the International Centre for Diffraction Data.