Hostname: page-component-7b9c58cd5d-dlb68 Total loading time: 0 Render date: 2025-03-15T04:36:19.690Z Has data issue: false hasContentIssue false
  • English
  • Français

D-73 High Resolution X-ray Diffraction of III-Nitride Wide Bandgap Semiconductors

Published online by Cambridge University Press:  20 May 2016

Q. Sun ,
B. Leung  and
J. Han
Q. Sun
Affiliation:
Yale University, New Haven, CT
B. Leung
Affiliation:
Yale University, New Haven, CT
J. Han
Affiliation:
Yale University, New Haven, CT
Rights & Permissions [Opens in a new window]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 25 , Issue 2 , June 2010 , pp. 218
Copyright
Copyright © Cambridge University Press 2010