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D-17 High-Resolution Reciprocal Space Mapping of InGaAs/GaAs Structures: From Pseudomorphic to Fully Relaxed State

Published online by Cambridge University Press:  20 May 2016

A. Ulyanenkov ,
F. Rinaldi ,
S. Menzel ,
A. Benediktovich ,
A. Zhilik ,
I. Feranchuk  and
K. Saito
A. Ulyanenkov
Affiliation:
Bruker AXS GmbH, Karlsruhe, Germany
F. Rinaldi
Affiliation:
Ulm University, Ulm, Germany
S. Menzel
Affiliation:
Ulm University, Ulm, Germany
A. Benediktovich
Affiliation:
Belarussian State University, Minsk, Belarus
A. Zhilik
Affiliation:
Belarussian State University, Minsk, Belarus
I. Feranchuk
Affiliation:
Belarussian State University, Minsk, Belarus
K. Saito
Affiliation:
Bruker AXS K.K., Yokohama, Japan
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Abstract

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Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 25 , Issue 2 , June 2010 , pp. 218
Copyright
Copyright © Cambridge University Press 2010