The Black Forest area of Germany provided the scenic setting for the 2015 Pharmaceutical Powder X-ray Diffraction Symposium (PPXRD), the 13th in the series (Figure 1).
![](https://static.cambridge.org/binary/version/id/urn:cambridge.org:id:binary-alt:20161210120727-33611-mediumThumb-S0885715615000597_fig1g.jpg?pub-status=live)
Figure 1. (Color online) Conference Chair Tom Blanton welcoming the PPXRD-13 Attendees.
Over 40 scientists from 16 different countries gathered at the Schwarzwald Panorama, in Bad Herrenalb, Germany, during the week of 18–22 May, to discuss the critical role of X-ray diffraction (XRD) methods in pharmaceutical analysis.
The symposium began with an optional, full-day workshop focusing on Quantitative Phase Analysis by X-ray Powder Diffraction (Figure 2), followed by two and a half days of technical sessions. They included:
-
• Patent Issues
-
• Amorphous, Activated, and Nano Materials
-
• Qualitative and Quantitative Analysis
-
• Powder X-Ray Diffraction Techniques/Crystal Structure Prediction/Crystal Structure Verification
-
• New Frontiers in XRD for Pharmaceutical Research and Development
-
• Complementary Techniques/Formulation and Product Development
![](https://static.cambridge.org/binary/version/id/urn:cambridge.org:id:binary-alt:20161210120727-10321-mediumThumb-S0885715615000597_fig2g.jpg?pub-status=live)
Figure 2. (Color online) Many thanks to our workshop instructors: (l to r) Detlef Beckers, PANalytical, Almelo, The Netherlands; Robert Dinnebier, Max-Planck Institute für Festkoerperforschung, Stuttgart, Germany; Fabia Gozzo, Excelsus Structural Solutions SPRL, Brussels, Belgium; and Arnaud Grandeury, Novartis Pharma AG, Basel, Switzerland.
The complete program, including abstracts, is available for viewing at http://www.icdd.com/ppxrd/13/program.htm.
In addition, an evening Poster Session and reception were held, hosted by International Centre for Diffraction Data (ICDD), in conjunction with a vendor exhibition. This event provided the perfect opportunity for attendees to network with colleagues, peruse the scientific posters, and discover the latest tools for XRD analysis as displayed by the vendors (Figure 3). The exhibition was held during two days of the symposium. We thank the following organizations that participated:
-
• Bruker AXS, Karlsruhe, Germany
-
• International Centre for Diffraction Data, Newtown Square, PA USA
-
• PANalytical GmbH, Kassel, Germany
-
• Rigaku, Ettlingen, Baden-Wurttemberg, Germany
-
• STOE & Cie GmbH, Darmstadt, Hessen, Germany
![](https://static.cambridge.org/binary/version/id/urn:cambridge.org:id:binary-alt:20161210120727-79380-mediumThumb-S0885715615000597_fig3g.jpg?pub-status=live)
Figure 3. (Color online) PPXRD-13 provided many opportunities for networking.
We also wish to thank the Organizing Committee for their efforts in creating a successful program filled with exciting talks, covering the range from fundamentals to cutting-edge developments (Figure 2)! If you have an idea for future symposiums, please feel free to contact any member of the Organizing Committee.
Do not miss the next PPXRD, scheduled for June 6-10, 2016, at the Sanibel Harbour Marriott in Fort Myers, Florida. Stay informed by visiting www.icdd.com/ppxrd.