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X-ray Microbeam Investigation of Deformation Microstructure in Microindented Cu
Published online by Cambridge University Press: 15 February 2011
Abstract
The deformation microstructure under spherical microindents in single crystal Cu has been investigated with submicron spatial resolution using x-ray structural microscopy. A polychromatic, submicron diameter (∼ 0.5 μm) microbeam was used in combination with micronresolution depth profiling to make direct, nondestructive measurements of plastic deformation induced lattice rotations under an indent made with a 69 μm radius spherical indenter and 200 mN maximum load. Lattice orientations relative to the undeformed crystal were determined as a function of position under the indent using differential-aperture x-ray structural microscopy (DAXM). Rotation-axes and misorientation-angles were determined for micron steps along selected microbeam penetration directions.
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- Copyright © Materials Research Society 2003
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