Hostname: page-component-6bf8c574d5-vmclg Total loading time: 0 Render date: 2025-02-16T01:22:58.293Z Has data issue: false hasContentIssue false
  • English
  • Français

Roughness Effect on the Lithium Diffusivity in WO3 Thin Films

Published online by Cambridge University Press:  16 February 2011

M. Maaza ,
A. Gorenstein ,
C. Sella ,
F. Bridou ,
B. Pardo ,
J. Corno ,
G. Rogera ,
O. Bohnke  and
C. Julien
M. Maaza
Affiliation:
Institut d'Optique Th éorique et Appliquée, associé au CNRS, Bat. 503, 91405 Orsay, France
A. Gorenstein
Affiliation:
Laboratoire de Physique des Solides, associd au CNRS, Universit é Pierre et Marie Curie 4 place Jussieu, 75252 Paris Cedex 05, France
C. Sella
Affiliation:
Laboratoire de Physique des Mat ériaux du CNRS, 92195 Meudon Principal, France
F. Bridou
Affiliation:
Institut d'Optique Th éorique et Appliquée, associé au CNRS, Bat. 503, 91405 Orsay, France
B. Pardo
Affiliation:
Institut d'Optique Th éorique et Appliquée, associé au CNRS, Bat. 503, 91405 Orsay, France
J. Corno
Affiliation:
Institut d'Optique Th éorique et Appliquée, associé au CNRS, Bat. 503, 91405 Orsay, France
G. Rogera
Affiliation:
Institut d'Optique Th éorique et Appliquée, associé au CNRS, Bat. 503, 91405 Orsay, France
O. Bohnke
Affiliation:
Laboratoire des Fluorures, Universit é du Maine, route de Laval, B.P.535 72017 Le Mans Cedex, France
C. Julien
Affiliation:
Laboratoire de Physique des Solides, associd au CNRS, Universit é Pierre et Marie Curie 4 place Jussieu, 75252 Paris Cedex 05, France
Get access

Abstract

In this work, we investigate the influence of surface roughness on the kinetics of Li+ during the insertion process in the well-known electrochromic material WO3. Thin films 500 Å thick have been grown by rf-sputtering and annealed in therange of 25-350ºC. Grazing angle X-ray reflectometry shows that the film roughnessincreases considerably with thermal treatment. These measurements are correlated with chemical diffusion investigations obtained by electrochemical titration in Li/WO3 cells.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 369: Symposium U – Solid State Ionics IV , 1994 , 125
Copyright
Copyright © Materials Research Society 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] Deb, S.K., Phil. Mag. 27, 801 (1973).Google Scholar
[2] Crandall, R.S. and Faughnan, B.W., App. Phys. Lett. 26, 120 (1975).Google Scholar
[3] Dautrement-Smith, W.C., Green, M. and Kang, K.S., Electrochim. Acta 22, 751 (1977).Google Scholar
[4] Mohapatra, S.K., J. Electrochem. Soc. 125, 284 (1978).Google Scholar
[5] Bonhke, O., Bonhke, C. and Amal, S., Mat. Sci. Eng. B 3, 197 (1989).Google Scholar
[6] Passerini, S., Scrosati, B., Gorenstein, A., Anderson, A.M. and Granqvist, C.G., J. Electrochem. Soc. 136, 3394 (1989).Google Scholar
[7] Granqvist, C.G., in Physics of Thin Films, Mechanic and Dielectric Properties, vol. 17, edited by Francombe, M.H. and Vossen, J.L. (Academic Press, New York, 1993), p. 301.Google Scholar
[8] Bridou, F. and Pardo, B., J. Optics 21, 183 (1990).Google Scholar
[9] Honders, A., Kinderen, J.M. Der, Heren, A.H. Van, Witt, J.H.W. De and Broers, G.H.J., Solid State Ionics 15, 265 (1985).Google Scholar
[10] Croce, P. and Pardo, B., Nouv. Rev. Opt. Appl. 1, 229 (1970).Google Scholar
[ll] Abelis, F., Ann. Phys. 12, 596 (1950).Google Scholar
[12] Pardo, B., Megademini, T. and Andre, J.M., Rev. Phys. Appl. 23, 1579 (1988).Google Scholar
[13] Nevot, L., Pardo, B. and Corno, J., Rev. Phys. Appl. 23, 1675 (1988).Google Scholar
[14] Agarwal, A. and Habibi, M., Thin Solid Films 129, 257 (1989).Google Scholar
[15] , Bohnke and Robert, G., Solid State Ionics 6, 115 (1982).Google Scholar
[16] Pereira-Ramos, J.P., Baddour-Hadjean, R., Kumagai, N. and Tanno, K, Electrochim. Acta 38, 431 (1993).Google Scholar
[17] Zhong, Q., Dahn, J.R. and Colbow, K., J. Electrochem. Soc. 139, 2406 (1992).Google Scholar
[18] Julien, C. and Nazri, G.A., Solid State Batteries: Materials Design and Optimization (Kluwer, Boston, 1994), p. 513.Google Scholar
[19]Dickens, P.G. and Reynolds, G.J., Solid State Ionics 5, 331 (1981).Google Scholar