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Rheed Intensity Monitored Growth of Bi-Sr-Ca-Cu-O Superconductors

Published online by Cambridge University Press:  26 February 2011

Shigeki Sakai ,
Yuji Kasai ,
Peter Bodin  and
Hirofumi Matsuhata
Shigeki Sakai
Affiliation:
Electrotechnical Laboratory, 1–1–4 Umezono, Tsukuba-shi, Ibaraki 305, Japan.
Yuji Kasai
Affiliation:
Electrotechnical Laboratory, 1–1–4 Umezono, Tsukuba-shi, Ibaraki 305, Japan.
Peter Bodin
Affiliation:
Electrotechnical Laboratory, 1–1–4 Umezono, Tsukuba-shi, Ibaraki 305, Japan.
Hirofumi Matsuhata
Affiliation:
Electrotechnical Laboratory, 1–1–4 Umezono, Tsukuba-shi, Ibaraki 305, Japan.
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Abstract

To make Bi2Sr2CaCu2O8 superconducting films with top insulating SrTiO3, we use the molecular beam epitaxy technique (MBE) with in situ monitoring by reflection high-energy electron diffraction (RHEED). A new (RHEED)image enhancing technique, difference reflection high-energy electron diffraction (DRHEED) gave striking information on the growth process of each layer in the Bi:2212 compound as well as the rough and flat transition occurring during co-evaporated deposition of SrTi03.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 275: Symposium S – Layered Superconductors: Fabrication, Properties and Applications , 1992 , 73
Copyright
Copyright © Materials Research Society 1992

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References

REFERENCES

[1] Johnsen, B. R., Bsauchamp, K. M., Wang, T., Liu, J -X., MoGreer, K. A., Wan, J -C., Tucminen, M., Zhang, Y -J., Mscartney, M. L., and Goldman, A. M., Appl. Phys. Lett. 56, 1911 (1990).Google Scholar
[2] Hellman, E. S., Hartford, E. H., and Fleming, R. M., Appl. Phys. Lett. 55, 2120 (1989).Google Scholar
[3] Bozovic, I., Eckstein, J. N., Klausrreier-Brown, M. E., and Virshup, G., J. Superoon. 5, 19 (1992).Google Scholar
[4] Kanai, M., Kavei, T. and Kawai, S., Jpn. J. Appl. Phys. 31, L331 (1992).Google Scholar
[5] Sakai, S., Kasai, Y., Hosokawa, S., and Ichintura, S., in Advances in Superconductivity III edited by Kajiraura, K. and Hayakawa, H., (Springer-Verlag, 1991) p.1085.6Google Scholar
[6] Bodin, P., Sakai, S., and Kasai, Y., to appear in Jpn. J. Appl. Phys.Google Scholar
[7] Sakai, S., Kasai, Y., and Bodin, P., Jpn. J. Appl. Phys., 31, L399 (1992).Google Scholar