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Preliminary Results from a New Spin Spectrometer

Published online by Cambridge University Press:  10 February 2011

J. G. Tobina ,
P. J. Bedrossiana ,
T. R. Cumminsb ,
G. D. Waddillb ,
S. Mishrac ,
P. Larsond ,
R. Negrid ,
M. Millerd ,
E. Petersond  and
P. Boyd
...Show all authors
J. G. Tobina
Affiliation:
Lawrence Livermore National Laboratory, Livermore, CA 94550
P. J. Bedrossiana
Affiliation:
Lawrence Livermore National Laboratory, Livermore, CA 94550
T. R. Cumminsb
Affiliation:
University of Missouri-Rolla, Department of Physics, Rolla, MO 65401–0249
G. D. Waddillb
Affiliation:
University of Missouri-Rolla, Department of Physics, Rolla, MO 65401–0249
S. Mishrac
Affiliation:
Virginia Commonwealth University, Dept of Physics, Richmond, VA 22384–2001
P. Larsond
Affiliation:
Physical Electronics, Inc., Eden Prairie, MN
R. Negrid
Affiliation:
Physical Electronics, Inc., Eden Prairie, MN
M. Millerd
Affiliation:
Physical Electronics, Inc., Eden Prairie, MN
E. Petersond
Affiliation:
Physical Electronics, Inc., Eden Prairie, MN
P. Boyd
Affiliation:
Boyd Technologies, Livermore, CA 94550
R. Gunion
Affiliation:
ESG Associates, Pleasanton, CA 94550
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Abstract

The first preliminary results from a novel spectrometer for elementally-specific measurements of magnetic surfaces and ultrathin films are presented here. The key measurements are based upon spin-resolving and photon-dichroic photoelectron spectroscopy. True spinresolution is achieved by the use of a Mini-Mott detection scheme. The photon-dichroic measurements include the variant magnetic x-ray linear dichroism (MXLD). Both a multi-channel, energy dispersive collection scheme as well as the spin-detecting Mini-Mott apparatus are used in data collection. The [Spin Spectrometer] is based at the Spectromicroscopy Facility (Beamline7)at the Advanced Light Source.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 524: Symposium V – Application of Synchrotron Radiation Techniques…IV , 1998 , 185
Copyright
Copyright © Materials Research Society 1998

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References

REFERENCES

1. Jonker, G. H. and Van Santen, J. H., Physica 16, 337 (1950) and G. H. Jonker, ibid. 22, 707 (1956); J. Volger, Physica 20, 49 (1954); C. W. Searle and S.T. Wang, Can. J. Phys. 47, 2703 (1969); ibid. 48, 2023 (1970).Google Scholar
2. von Helmholt, R.,et al, Phys. Rev. Lett. 71, 2331 (1993); S. Jin, et al, Science, 264, 413 (1994); M.A. Subramanian,, et al, Science 273, 81 (1996).Google Scholar
3. Pool, R., Science 261, 984 (20-AUG-93); T. L.Hylton, et al, Science, 261, 1021 (20-AUG-93).Google Scholar
4. Parkin, S. S. P., Phys. Rev. Lett. 71, 1641 (1993); A. C. Ehrlich, Phys. Rev. Lett. 71, 2300 (1993).Google Scholar
5. Grolier, V., et al, Phys. Rev. Lett. 71, 3023 (1993).Google Scholar
6. Gurney, B.A., et al, Phys. Rev. Lett. 71, 4023 (1993).Google Scholar
7. Dieny, B., et al, J. Appl. Phys. 69, 4774 (1991).Google Scholar
8. Dieny, B., et al, Phys. Rev. B 43, 1297 (1991).Google Scholar
9. Falicov, L. M., et al, J. Mat. Res. 5, 1299 (1990).Google Scholar
10. Carbone, C. and Kisker, E., Solid State Commun. 65, 1107 (1988); F. U. Hillebrecht, R. Jungblut, and E. Kisker, Phys. Rev. Lett. 65, 2450 (1990).Google Scholar
11. Carbone, C., Kachel, T., Rochow, R., and Gudat, W., Z. Phys. B 79, 325 (1990).Google Scholar
12. Roth, C. H., et al Phys. Rev. Lett. 70, 3479 (1993); Solid State Commun. 8-6, 647 (1993); F.U. Hillebrecht, et al, Phys. Rev. Lett. 75, 2883 (1995); F. U. Hillebrecht, et al, Phys. Rev. B. 53, 12182 (1996).Google Scholar
13. Rossi, G., et al Solid State Commun. 90, 557 (1994); F. Sirotti and G. Rossi, Phys. Rev. B 49, 15682 (1994).Google Scholar
14. Cann, X. Le, Boeglin, C., Carriere, B., and Hricovini, K., Phys. Rev. B 54, 373 (1996).Google Scholar
15. Kuch, W., et al, Phys. Rev. B 51, 609 (1995); C. M. Schneider, et al, Phys. Rev. B 45, 5041 (1992).Google Scholar
16. Baumgarten, L., et al, Phys. Rev. Lett. 65, 492 (1990).Google Scholar
17. Waddill, G. D., et al Phys. Rev. B 46, 552 (1992); E. Tamura, et al, Phys. Rev. Lett. 73, 1533 (1994).Google Scholar
18. Starke, K., et al, Phys. Rev. 50, 1317 (1994); K. Starke, et al, Phys. Rev. B 48, 1329 (1993).Google Scholar
19. Tobin, J. G., et al, J. Appl. Phys. 79,5626 (1996); J. Vac. Sci. Tech. B 14, 3171 (1996).Google Scholar
20. Waddill, G.D., et al, Phys. Rev. B 50, 6774 (1994); J. G. Tobin, et al, Surf. Rev. Lett. 3, 1429 (1996).Google Scholar
21. Unguris, J., et al Rev. Sci. Instrum. 57, 1314 (1986), and references therein.Google Scholar
22. Pappas, D. P., J. Vac. Sci. Tech. B 14, 3203 (1996), and references therein.Google Scholar
23. Heimann, P., et al, Rev. Sci. Instrum. 66, Feb (1995); T. Warwick, et al, Rev. Sci. Instrum. 66, Feb (1995).Google Scholar
24. Kortright, J. B., et al., Appl. Phys. Lett. 60, 2963 (1992); J. B. Kortright, and J. H. Underwood, Nucl. Instrum. and Methods A291, 272 (1990).Google Scholar
25. Physical Electronics, OMNI Package.Google Scholar
26. Physical Electronics, X-Ray Emission Spectrometer.Google Scholar
27. Kuyalt, C. E. and Simpson, J. A., Rev. Sci. Instrum., 38, 103 (1967); E. M. Purcell, Phys. Rev. 54, 818 (1938).Google Scholar
28. Huang, D.-J., et al, Rev. Sci. Instrum. 64, 3474 (1993).Google Scholar
29. Roth, Ch., Hillebrecht, F. U., Park, W. G., Rose, H. B., and Kisker, E., Phys. Rev. Lett. 73, 1963 (1994).Google Scholar