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Grain Rotations during Tensile Deformation of Columnar Tantalum
Published online by Cambridge University Press: 15 February 2011
Abstract
We report on tensile tests performed on thin sheet samples of tantalum that have a nearcolumnar structure. By annealing sheet of approximately 1 mm thickness at high temperatures, a columnar structure is generated with grain boundaries nearly perpendicular to the flat surfaces. The purpose of the experiments is to investigate the mechanical behavior in terms of crystal plasticity in a geometry that is readily amenable to both experimental characterization and computer simulation. Automated electron backscatter diffraction (EBSD) has been used to obtain orientation maps both before and after deformation. For the small strains used in this study (<10%), the grains deform rather uniformly with little evidence of cell formation. Analysis of the lattice rotations shows considerable scatter in the rotation axis and demonstrates significant disagreement with polycrystal plasticity calculations.
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- Copyright © Materials Research Society 2003