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Dislocations Nucleating Growth in Liquid Phase Epitaxy of Gallium Arsenide
Published online by Cambridge University Press: 15 February 2011
Abstract
Dislocations in GaAs are analysed by X-ray topography in order to relate their nature to their efficiency in generating growth steps. The analysis is mainly based on comparing double crystal back reflection images of the defects to calculated misorientations of the crystal surface which are caused at the outcrop. All types of dislocations are equally effective provided their Burgers vector has a component normal to the growth interface. Concentric growth step patterns, which develop in varying numbers on different samples are not caused by substrate dislocations.
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- Copyright © Materials Research Society 1993