Hostname: page-component-6bf8c574d5-b4m5d Total loading time: 0 Render date: 2025-02-15T11:12:51.036Z Has data issue: false hasContentIssue false
  • English
  • Français

Dislocation Core Spreading at Interfaces between Crystalline and Amorphous Solids

Published online by Cambridge University Press:  18 March 2011

Huajian Gao ,
Lin Zhang  and
Shefford P. Baker
Huajian Gao
Affiliation:
Max Plank Institute for Metals Research, Seestr. 92, D-70174 Stuttgart, Germany Department of Mechanical Engineering, Stanford University, Stanford, CA 94305, USA
Lin Zhang
Affiliation:
Department of Mechanical Engineering, Stanford University, Stanford, CA 94305, USA
Shefford P. Baker
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY 14853, USA
Get access

Abstract

A fundamental question addressed here is concerned with the equilibrium structure of a dislocation core at an interface between a crystalline and an amorphous solid. This is motivated by experimental observations that the contrast of dislocations at an interface between a crystalline film and an amorphous substrate disappears under transmission electron microscopy. We have developed a mathematical moedl to describe the time-dependent behavior of dislocation core spreading as a function of the adhesive strength of the interface. The equilibrium core width and the rate of core spreading are determined in closed form solutions.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 673: Symposium P – Dislocations and Deformation Mechanisms in Thin Films and Small Structures , 2001 , P6.6
Copyright
Copyright © Materials Research Society 2001

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Matthews, J. W., Mader, S. and Light, T. B. (1970) J. of Applied Physics, 41, 3800–3804.Google Scholar
[2] Freund, L. B. (1987) Journal of Applied Mech., 54, 553–557.Google Scholar
[3] Nix, W. D. (1989) Mechanical properties of thin films, Metall. Trans, 20A, 2217–2245.Google Scholar
[4] Bean, J. C., Feldman, L. C., Fiory, A. T., Nakahara, S. and Robinson, I. K. (1984) J. Vac. Sci. Technol. A, 2, 436–440.Google Scholar
[5] Venkatraman, R and Bravman, J. C. (1992) J. Mater. Res., 7, 2040.Google Scholar
[6] Eshelby, J. D. (1949) Phil. Mag., 40, 903 Google Scholar
[7] Muellner, P. and Arzt, E. (1998) in ”Thin Films: Stresses and Mechanical Properties VII” ed: Cammarata, R. C., Nastasi, M., Busso, E. P., Oliver, W. C., Mat. Res. Soc. Symp. Proc., 505, 149–154.Google Scholar
[8] Dehm, G. and Arzt, E. (2000). Appl. Phys. Lett., 77, 1126–1128.Google Scholar
[9] Hirth, J. P. and Lothe, J. (1982) Theory of Dislocations, 2nd edn., John Wiley and Sons.Google Scholar
[10] Muskhelishvili, N. I. (1977) Singular Integral Equations, Noordhoff, Leyden.Google Scholar
[11] Zhang, L. (2000) Ph.D. Dissertation, Stanford University, Standford, CA.Google Scholar