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Automatic Orientation Mapping with Synchrotron Radiation

Published online by Cambridge University Press:  21 February 2011

G. Gottstein
G. Gottstein*
Affiliation:
Department of Metallurgy, Mechanics & Materials Science Michigan State University East Lansing, MI 48824
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Abstract

Synchrotron radiation can be utilized to obtain Laue back reflection patterns of microscopic areas with very short exposure time. A method is presented to fully automatically evaluate Laue patterns. The experimental setup and procedure are outlined to determine the orientations of a large number of contiguous grains, and consequently to enable orientation mapping. Preliminary experimental results are presented.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 143: Symposium V – Synchrotron Radiation in Materials Research , 1988 , 259
Copyright
Copyright © Materials Research Society 1989

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References

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