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Discrete dislocation sim ulation of thin film plasticit y

Published online by Cambridge University Press:  18 March 2011

B. von Blanckenhagen ,
P. Gumbsch  and
E. Arzt
B. von Blanckenhagen
Affiliation:
Max-Planc k-Institute for Metals Researc h, Seestr. 92, D-70174 Stuttgart, German y
P. Gumbsch
Affiliation:
Max-Planc k-Institute for Metals Researc h, Seestr. 92, D-70174 Stuttgart, German y
E. Arzt
Affiliation:
Max-Planc k-Institute for Metals Researc h, Seestr. 92, D-70174 Stuttgart, German y
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Abstract

A discrete dislocation dynamics sim ulation is used to investigate dislocation motion in the confined geometry of a polycrystalline thin film. The repeated activ ation of a Frank-Read source is sim ulated. The stress to activate the sources and to initiate plastic fiow is significantly higher than predicted by models where the dislocations extend o ver the entire film thic kness. An efiective source size, which scales with the grain dimensions, yields fiow stresses in reasonable agreemen t with experimen ts. The infiuence of dislocations deposited at interfaces is investigated by comparing calculations for a film sandwic hed between a substrate and a capping layer with those for a free standing film.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 673: Symposium P – Dislocations and Deformation Mechanisms in Thin Films and Small Structures , 2001 , P2.3
Copyright
Copyright © Materials Research Society 2001

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References

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