Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Xu, Shengyong
Tian, Mingliang
Wang, Jinguo
Xu, Jian
Redwing, Joan M.
and
Chan, Moses H. W.
2005.
Nanometer‐Scale Modification and Welding of Silicon and Metallic Nanowires with a High‐Intensity Electron Beam.
Small,
Vol. 1,
Issue. 12,
p.
1221.
Richter, C.A.
Stewart, D.R.
Ohlberg, D.A.A.
and
Williams, R.Stanley
2005.
Electrical characterization of Al/AlOx/molecule/Ti/Al devices.
Applied Physics A,
Vol. 80,
Issue. 6,
p.
1355.
Ramachandran, Ganesh K
Edelstein, Monica D
Blackburn, David L
Suehle, John S
Vogel, Eric M
and
Richter, Curt A
2005.
Nanometre gaps in gold wires are formed by thermal migration.
Nanotechnology,
Vol. 16,
Issue. 8,
p.
1294.
Galperin, M.
and
Beratan, D. N.
2005.
Simulation of Scanning Tunneling Microscope Images of 1,3-Cyclohexadiene Bound to a Silicon Surface.
The Journal of Physical Chemistry B,
Vol. 109,
Issue. 4,
p.
1473.
Liu, X.-Y.
Raynolds, J. E.
Wells, C.
Welch, J.
and
Cale, T. S.
2005.
First-principles modeling of electronic transport in π-stacked molecular junctions.
Journal of Applied Physics,
Vol. 98,
Issue. 3,
Triozon, François
Lambin, Philippe
and
Roche, Stephan
2005.
Electronic transport properties of carbon nanotube based metal/semiconductor/metal intramolecular junctions.
Nanotechnology,
Vol. 16,
Issue. 2,
p.
230.
Hsu, Julia W.P.
2005.
Soft lithography contacts to organics.
Materials Today,
Vol. 8,
Issue. 7,
p.
42.
Li, Wenjie
Kavanagh, Karen L.
Matzke, Carolyn M.
Talin, A. Alec
Léonard, François
Faleev, Sergey
and
Hsu, Julia W. P.
2005.
Ballistic Electron Emission Microscopy Studies of Au/Molecule/n-GaAs Diodes.
The Journal of Physical Chemistry B,
Vol. 109,
Issue. 13,
p.
6252.
Dholakia, Geetha R.
Fan, W.
and
Meyyappan, M.
2005.
Effect of monolayer order and dynamics on the electronic transport of molecular wires.
Applied Physics A,
Vol. 80,
Issue. 6,
p.
1215.
Galperin, Michael
and
Nitzan, Abraham
2005.
Current-Induced Light Emission and Light-Induced Current in Molecular-Tunneling Junctions.
Physical Review Letters,
Vol. 95,
Issue. 20,
Richter, Curt A.
Hacker, Christina A.
and
Richter, Lee J.
2005.
Electrical and Spectroscopic Characterization of Metal/Monolayer/Si Devices.
The Journal of Physical Chemistry B,
Vol. 109,
Issue. 46,
p.
21836.
Shaporenko, Andrey
Elbing, Mark
Błaszczyk, Alfred
von Hänisch, Carsten
Mayor, Marcel
and
Zharnikov, Michael
2006.
Self-Assembled Monolayers from Biphenyldithiol Derivatives: Optimization of the Deprotection Procedure and Effect of the Molecular Conformation.
The Journal of Physical Chemistry B,
Vol. 110,
Issue. 9,
p.
4307.
Lang, Norton D.
and
Kagan, Cherie R.
2006.
The Role of Chemical Contacts in Molecular Conductance.
Nano Letters,
Vol. 6,
Issue. 12,
p.
2955.
Kushmerick, James G.
Blum, Amy Szuchmacher
and
Long, David P.
2006.
Metrology for molecular electronics.
Analytica Chimica Acta,
Vol. 568,
Issue. 1-2,
p.
20.
Richter, C.A.
Hacker, C.A.
Richter, L.J.
Kirillov, O.A.
Suehle, J.S.
and
Vogel, E.M.
2006.
Interface characterization of molecular-monolayer/SiO2 based molecular junctions.
Solid-State Electronics,
Vol. 50,
Issue. 6,
p.
1088.
Garno, Jayne C.
and
Batteas, James D.
2006.
Applied Scanning Probe Methods IV.
p.
105.
Müller‐Meskamp, L.
Lüssem, B.
Karthäuser, S.
Prikhodovski, S.
Homberger, M.
Simon, U.
and
Waser, R.
2006.
Molecular structure of ferrocenethiol islands embedded into alkanethiol self‐assembled monolayers by UHV‐STM.
physica status solidi (a),
Vol. 203,
Issue. 6,
p.
1448.
Caruso, A. N.
Wang, L. G.
Jaswal, S. S.
Tsymbal, E. Y.
and
Dowben, P. A.
2006.
The interface electronic structure of thiol terminated molecules on cobalt and gold surfaces.
Journal of Materials Science,
Vol. 41,
Issue. 19,
p.
6198.
Chae, Dong-Hun
Berry, John F.
Jung, Suyong
Cotton, F. Albert
Murillo, Carlos A.
and
Yao, Zhen
2006.
Vibrational Excitations in Single Trimetal-Molecule Transistors.
Nano Letters,
Vol. 6,
Issue. 2,
p.
165.
Walczak, Kamil
2006.
Spin-dependent shot noise of inelastic transport through molecular quantum dots.
Journal of Magnetism and Magnetic Materials,
Vol. 305,
Issue. 2,
p.
475.