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In situ TEM nanomechanics

Published online by Cambridge University Press:  13 January 2015

Q. Yu ,
M. Legros  and
A.M. Minor
Q. Yu
Affiliation:
Center of Electron Microscopy and State Key Laboratory of Silicon Materials, Department of Materials Science and Engineering, Zhejiang University, China; qyuzju@gmail.com
M. Legros
Affiliation:
Centre d’Elaboration des Matériaux et d’Etudes Structurales, Centre National de la Recherche Scientifique, France; marc.legros@cemes.fr
A.M. Minor
Affiliation:
Department of Materials Science and Engineering, University of California–Berkeley, and Lawrence Berkeley National Laboratory, USA; aminor@berkeley.edu
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Abstract

In situ transmission electron microscopy (TEM) nanomechanical testing has benefited from a number of recent technical developments related to both how deformation is imaged and how deformation is induced and measured inside a TEM instrument. These developments have led to new insights into the deformation mechanisms of a wide range of metals and alloys, as well as measurements of the unusual mechanical properties of small-scale objects such as whiskers and nanocrystals. Herein, we describe this recent progress through selected highlights of recent findings on the dynamic behavior of defects such as dislocations, twins, and grain boundaries.

Keywords

Stress/strain relationshipstrengthductilitydislocationsgrain boundariestransmission microscopy
Type
Research Article
Information
MRS Bulletin , Volume 40 , Issue 1: Frontiers of in situ electron microscopy , January 2015 , pp. 62 - 70
Copyright
Copyright © Materials Research Society 2015 

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