Hostname: page-component-6bf8c574d5-9nwgx Total loading time: 0 Render date: 2025-02-19T12:00:47.170Z Has data issue: false hasContentIssue false
  • English
  • Français

What Can Data Analysis Do for X-Ray Microfluorescence Analysis?

Published online by Cambridge University Press:  06 March 2019

John D. Zahrt
John D. Zahrt*
Affiliation:
Applied Theoretical Physics Division, Los Alamos National Laboratory
Get access

Extract

In 1985 Nichols and Ryon [1] first demonstrated their x-ray microfluorescence analysis (XRMF) system. By 1986 Nichols et al. [2] Boehme [3] and Gurker [4] provided us with spectacular photographs of x-ray images of geological materials, wire grids, and semiconductor chip carriers. During the delivery of the paper by Nichols et al. [2] the present author realized that a higher degree of spatial resolution could be accomplished by analysis of the raw data.

Type
III. XRF Mathematical Models and Quantitation
Information
Advances in X-Ray Analysis , Volume 32: Thirty-Seventh Annual Conference on Applications of X-ray Analysis, August 1-5, 1988 , 1988 , pp. 89 - 95
Copyright
Copyright © International Centre for Diffraction Data 1988

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] Nichols, M. C. , and Ryon, R. W. , “An X-Ray Micro-Fluorescence Analysis System With Diffraction Capabilities,’ Adv. in X-Ray Anal. 29. 423–426 (1986).Google Scholar
[2] Nichols, Monte C. , et al. , “Parameters Affecting X-Ray Micro fluorescence Analysis,” Adv. in X-Ray Anal. 30, 45–51 (1987).Google Scholar
[3] Boehme, Dale R. , “X-Ray Microfluorescence of Geologic Materials,” Adv. in X-Ray Anal. 30, 39–44 (1987).Google Scholar
[4] Gurker, N. , “Imaging Techniques for X-Ray Fluorescence and X-Ray Diffraction,” Adv. in X-Ray Anal. 30, 53–65 (1987).Google Scholar
[5] Zahrt, John D. , “High Spatial Resolution in X-Ray Fluorescence,” Adv. in X-Ray Anal. 30, 77–83 (1987).Google Scholar
[6] Zahrt, John D. and Carter, Natalie. “The Weierstrass Transform in X-Ray Analysis,” Accepted for publication in Lecture Notes in Pure and Applied Mathematics. Google Scholar
[7] Philip, J. , “The Most Ill-Posed Non-Negative Kernels in Discrete Deconvolution”, Invers. Prob. , 3, 309–328 (1987).Google Scholar
[8] Faber, V. and Wing, G. Milton, “The Abel Integral Equation,” LA-11-16-MS, Los Alamos National Laboratory, 1987.Google Scholar
[9] Faber, V. , personal communication, 1988.Google Scholar
[10] Butler, K. , Reeds, K. and Dawson, S. , “Estimating Solutions of First Kind Integral Eqns. with Nonnegative Constraints and Optical Smoothing,” Siam J. Numer. Anal. 18, 381–397 (1981).Google Scholar
[11] Groetsch, C. , The Theory of Tikhonov Regularization for Fredholm equations of the First Kind, Pitman Pub. , Boston, 1984.Google Scholar
[12] Triay, I. , and Rundberg, R. , “Determination of Selectivity Coefficient Distributions by Deconvolution of Ion-Exchange Isotherms,” J. Phys. Chem. 91 5269–5274 (1987).Google Scholar