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Stress Measurement at Fatigue Crack Tip using PSPC

Published online by Cambridge University Press:  06 March 2019

Yasuo Yoshioka
Yasuo Yoshioka*
Affiliation:
Musashi Institute of Technology, 1 Tamazutsumi, Setagaya, Tokyo 158, Japan
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Extract

The growth of fatigue crack builds up the compressive residual stress with the plastic zone in front of the crack tip. The presence of this residual stress is one of the main causes for the crack closure. The consequence of residual stress is a reduction of the crack tip stress intensity variation during a load cycle. Although this effect is well understood in a qualitative manner, it has not been completely quantified because of a lack of information about the load and residual stress distributions at the crack tip.

Type
II. X-Ray Strain and Stress Determination
Information
Advances in X-Ray Analysis , Volume 27: Thirty-Second Annual Conference on Applications of X-ray Analysis, August 1-5, 1983 , 1983 , pp. 191 - 196
Copyright
Copyright © International Centre for Diffraction Data 1983

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References

1. Elber, W., ASTM STP, 486:230(1971).Google Scholar
2. Taira, S., Tanaka, K. and Shimada, T., J. JSMS, 21:1142(1972).Google Scholar
3. Honda, K., Hosokawa, N. Sarai, T. and Okamoto, K., J. JSMS, 31:210 (1982).Google Scholar
4. Schlosberg, W. and Cohen, J., Met. Trans., 13A:1987(1982).Google Scholar
5. Yoshioka, Y., Hasegawa, K. and Mochiki, K., Adv. X-Ray Analysis, 23:325 (1980).Google Scholar
6. Rice, J., ASTM STP, 4 15:247(1967).Google Scholar
7. Yoshioka, Y., Hasegawa, K. and Mochiki, K., Adv. X-Ray Analysis, 26:209(1983).Google Scholar
8. Stephan, D. and Richter, K., Crystal Research and Technology, 16:57(1981).Google Scholar
9. James, M. and Cohen, J., Adv. X-Ray Analysis, 19:695(1975).Google Scholar