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Proton-Induced X-Ray Emission Spectroscopy in Elemental Trace Analysis
Published online by Cambridge University Press: 06 March 2019
Abstract
Using protons in the MeV range as excitation source and a high resolution Si(Li) detector, X-ray emission spectroscopy is shown to be capable of analysing many elements with Z > 15 simultaneously at the 10-12 g level, This work discusses a theoretical lower limit of detection at moderate proton energies and gives examples of possible applications: analysis of the elemental composition of air-borne particles as a function of particle size, oil slick identification, and analysis of water and blood serum.
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- Copyright © International Centre for Diffraction Data 1971
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