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The Perspectives of High-Accuracy X-Ray Fluorescence Analysis - Some Fundamental Aspects and Applications

Published online by Cambridge University Press:  06 March 2019

V. I. Smolniakov
V. I. Smolniakov*
Affiliation:
Neutron Research Department Petersburg Neutron Physics Institute (PNPI) Russian Academy of Sciences 188350, Gatchina, Sankt-Petersburg, Russia
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Abstract

The fundamental approach to calculating the chemical element content resulting from x-ray fluorescence measurements has been substantiated theoretically. The elaboration of the calculation algorithm has proved the physical-mathematical model for the x-ray fluorescence intensity arising from photon irradiation and spectrometry peculiarities.

Special attention has been put on the real processes, in these elaborated algorithms. They take into account all the valuable effects influencing the x-ray fluorescence intensities, as well as the. stability of the equipment measurements. The results of some applications are shown.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 39: Forty-Fourth Annual Conference on Applications of X-ray Analysis, July 31 - August 4, 1995 , 1995 , pp. 815 - 820
Copyright
Copyright © International Centre for Diffraction Data 1995

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References

1. Tertian, R., 1988, Unification of Fundamental Matrix Correction Methods in X-ray Fluorescence Analysis. Arguments for a New Binary Coefficient Approach, X-ray Spectrometry, 17:89.Google Scholar
2. Smolniakov, V. I. and Koltoun, I. A., 1994, New Empirical Regression Type Algorithm and Software for High Precision XRF Spectrometry, Advances in X-Ray Analysis, 37:657.Google Scholar