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The Influence of Stress Gradient on X-ray Stress Measurement

Published online by Cambridge University Press:  06 March 2019

Masaaki Ohtsuka ,
Hideaki Matsuoka ,
Yukio Hirose  and
Hitoshi Ishii
Masaaki Ohtsuka
Affiliation:
Musashi Seimitsu Industry Co. Ltd. 39-5 daizen, Ueta, Toyohashi 441 Japan
Hideaki Matsuoka
Affiliation:
Musashi Seimitsu Industry Co. Ltd. 39-5 daizen, Ueta, Toyohashi 441 Japan
Yukio Hirose
Affiliation:
Department of Materials Science and Engineering, Kanazawa University, Kakuma-machi, Kanazawa, 920-11 JAPAN
Hitoshi Ishii
Affiliation:
Department of Engineering, Shizuoka University 3-5-1 Jyouhoku, Hamamatsu432 Japan
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Extract

The various machine parts made of fine ceramics are usually finished by grinding. The X-ray elastic constants in ground ceramics are measured by the X-ray diffraction method, as a result a measurement error can occur. The cause of the error is the stress gradient in the material produced by the grinding. In the case of material in which a stress gradient is present, X-ray stress measurement data show non-linear 2θφψ- sin2ψ diagrams. Until now, the X-ray stress measurement by the sin2ψ method makes use of effectively linear 2θφψ - sin2ψ diagrams. In the case of 2θφψ - sin2ψ diagrams showing non-linear behavior, however, good analysis method are generally not available.

Type
V. Residual Stress, Crystallite Size and rms Strain Determination by Diffraction Methods
Information
Advances in X-Ray Analysis , Volume 38: Forty-third Annual Conference on Applications of X-ray Analysis , 1994 , pp. 463 - 470
Copyright
Copyright © International Centre for Diffraction Data 1994

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References

1. Sasaki, T., Kuramoto, M. and Yosioka, Y., “Procedure to Estimate Residual Stress Distribution Depth by X-Ray Stress Measurement”, The 32nd Japan Congress on Material Research, 115;1989.Google Scholar
2. Ohtsuka, M., Matsuoka, H., Hirose, Y. and Ishii, H., “Measurement of X-Ray Elastic Constants From Ground Ceramic Showing Non-Linear sin2ψ Diagrams”, Advances in X-Ray Analysis, Vol.37, 305;1994.Google Scholar
3. Sasaki, T., Kuramoto, M. and Yoshioka, Y., “Determination of Stress Distribution in the Thickness Direction of Thin Films by Means of X-Rays”, The Japan Society for Non-Destructive Inspection, Vol.42, 37;1993.Google Scholar