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High Temperature Guinier X-Ray Diffractometry for Thermal Expansion Measurements in the Hexagonal form of Cordierite ((2MgO·2Al2O3·5SiO2)*
Published online by Cambridge University Press: 06 March 2019
Abstract
A computer-controlled high temperature Guinier diffractometer system for accurate determination of lattice thermal expansion is described. A critical test of the system using α-Al2O3 (0.3μ polishing alumina) showed close agreement with the single crystal expansion data of Wachtman et al. Lattice thermal expansion of cordierite doped with the following dopants: Ge+4, P+5, Zn+2, Li+1 and Ca+2 was investigated. Of these the Li+1 at the 5% level (5% of Si+4 replaced by Li+1 + Al+3) produced the largest decrease in mean lattice expansion.
- Type
- V. Other XRD Applications
- Information
- Copyright
- Copyright © International Centre for Diffraction Data 1983
Footnotes
Present address: Systems Planning Corp., Arlington, VA
Work supported by DOE on contract DE-AC02-81ER10896.