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High Resolution X-Ray Fluorescence Si Kβ Spectra: A Possible New Method for the Determination of Free Silica in Airborne Dusts

Published online by Cambridge University Press:  06 March 2019

J Purton ,
D S Urch  and
N G West
J Purton
Affiliation:
Chemistry Department, Queen Mary College, Mile End Road, London El 4NS, UK
D S Urch
Affiliation:
Chemistry Department, Queen Mary College, Mile End Road, London El 4NS, UK
N G West
Affiliation:
Occupational Medicine and Hygiene Laboratories, Health and Safety Executive, 403 Edgware Road, London NW2 6LN, UK
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Abstract

High resolution x-ray emission spectroscopy (HRXES) has been used to record the Si Kβ spectra of a variety of minerals. Distinct changes in peak profile can be related to mineral typo. Representatives spectra were chosen and incorporated, into a computer programme to allow the determination of free silica in binary and quaternary mixtures. The potential of HRXES for the analysis of airborne dust samples is discussed.

Type
V. XRF Applications
Information
Advances in X-Ray Analysis , Volume 32: Thirty-Seventh Annual Conference on Applications of X-ray Analysis, August 1-5, 1988 , 1988 , pp. 177 - 183
Copyright
Copyright © International Centre for Diffraction Data 1988

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References

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